Test embedded technologies in a simulated environment

Hardware-in-Loop Test Systems

FEV’s custom HiL test systems offer a comprehensive and flexible solution that gives engineers the ability to make customizations to fit their needs. Our HiL test systems cover all vehicle domains and are suited for component tests to network testing, and every scenario in between.


  • The open, modular architecture allows the flexibility needed to meet the most demanding embedded software test challenges for various ECUs, LRUs and system integration labs
  • Model integration for simulation environments 
  • Electrical load integration